Portada

THERMAL AND POWER MANAGEMENT OF INTEGRATED CIRCUITS IBD

SPRINGER
11 / 2010
9781441938329
Inglés

Sinopsis

Power, Junction Temperature, and Reliability.- Burn-in as a Reliability Screening Test.- Thermal and Electrothermal Modeling.- Thermal Runaway and Thermal Management.- Low Temperature CMOS Operation.

PVP
195,86