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DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS IBD

SPRINGER
02 / 2010
9781441942852
Inglés

Sinopsis

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

PVP
244,29